ESEM-analys

Electron Scanning Microscope Philips XL-30- ESEM-FEG SEM

Capabilities:
– high vacum, low vacuum and wet mode
– SE
– BSE
– GSE
– CL detectorer
– EDX system for analyses of elements (C and heavier elements)
– EBSD analysis
– Peltier cooled specimen and heating stages up to 1 000°C

For information and booking contact:
Marianne Ahlbom +46 (0)8 16 47 44
This email address is being protected from spambots. You need JavaScript enabled to view it.