Analysis with experimental setup
Instrument: Electron Backscatter Diffraction Analysis

The upgraded SEM has the following specifications/capabilities. Many of these combined facilities are not available on any one instrument in Scandinavia.

• The specialised SEM configuration, equipment specification and detector responses enable heating of experimental charges up to 750°C and down to - 180°C while collecting compositional contrast images, crystallographic orientation contrast images, surface topographic images, electron backscatter diffraction patterns (EBSPs) and EDS spectra.

• The SEM is equipped with an advanced EBSD detector system, the “Nordlys II” detector provided by OI-HKL Technology icon for external page (Denmark)

The special polishing facility needed for EBSD analysis is also available.

For information and booking contact:
Marianne Ahlbom +46 (0)8 16 47 44

Department of Geological Sciences
Svante Arrhenius väg 8, SE-106 91 Stockholm, Sweden | Phone: +46 (0)8 16 20 00 | Web administrator ines.jakobsson[at]geo.su.se
In case of emergency call (08) 16 22 16 or (08) 16 42 00