ESEM-analys

Philips XL-30- ESEM-FEG SEM
Instrument: Electron Scanning Microscope

Capabilities:
• high vacum, low vacuum and wet mode
• SE
• BSE
• GSE
• CL detectorer
• EDX system for analyses of elements (C and heavier elements)
• EBSD analysis
• Peltier cooled specimen and heating stages up to 1 000°C

For information and booking contact:
Marianne Ahlbom +46 (0)8 16 47 44
marianne.ahlbom[at]geo.su.se

Department of Geological Sciences
Svante Arrhenius väg 8, SE-106 91 Stockholm, Sweden | Phone: +46 (0)8 16 20 00 | Web administrator ines.jakobsson[at]geo.su.se
In case of emergency call (08) 16 22 16 or (08) 16 42 00